Region Control Oriented Stacked CMOS Image Sensor with Array-Parallel ADC Architecture

Takahito Yamauchi; Tomohiro Takahashi; Yuichi Kaji; Yasunori Tsukuda; Shinichiro Futami; Katsuhiko Hanzawa; Ping Wah Wong; Frederick Brady; Phil Holden; Thomas Ayers; Kyohei Mizuta; Susumu Ohki; Keiji Tatani; Takashi Nagano; Hayato Wakabayashi; Yoshikazu Nitta

doi:10.11485/itetr.41.32.0_35

41.32 Information Sensing Technologies(IST)

Session ID : IST2017-57

DOI https://doi.org/10.11485/itetr.41.32.0_35

Conference information

Host: Information Sensing Technologies(IST)

Name : Information Sensing Technologies(IST)

Date : September 25, 2017

Region Control Oriented Stacked CMOS Image Sensor with Array-Parallel ADC Architecture

*Takahito Yamauchi, Tomohiro Takahashi, Yuichi Kaji, Yasunori Tsukuda, Shinichiro Futami, Katsuhiko Hanzawa, Ping Wah Wong, Frederick Brady, Phil Holden, Thomas Ayers, Kyohei Mizuta, Susumu Ohki, Keiji Tatani, Takashi Nagano, Hayato Wakabayashi, Yoshikazu Nitta

Author information

*Takahito Yamauchi [Japan]
Sony Semiconductor Solutions Corporation [Japan]
Tomohiro Takahashi [Japan]
Sony Semiconductor Solutions Corporation [Japan]
Yuichi Kaji [Japan]
Sony Electronics Incorporated
Yasunori Tsukuda [Japan]
Sony Semiconductor Solutions Corporation [Japan]
Shinichiro Futami [Japan]
Sony Semiconductor Solutions Corporation [Japan]
Katsuhiko Hanzawa [Japan]
Sony Electronics Incorporated
Ping Wah Wong
Sony Electronics Incorporated
Frederick Brady
Sony Electronics Incorporated
Phil Holden
Sony Electronics Incorporated
Thomas Ayers
Sony Electronics Incorporated
Kyohei Mizuta [Japan]
Sony Semiconductor Solutions Corporation [Japan]
Susumu Ohki [Japan]
Sony Semiconductor Solutions Corporation [Japan]
Keiji Tatani [Japan]
Sony Semiconductor Solutions Corporation [Japan]
Takashi Nagano [Japan]
Sony Semiconductor Solutions Corporation [Japan]
Hayato Wakabayashi [Japan]
Sony Electronics Incorporated
Yoshikazu Nitta [Japan]
Sony Semiconductor Solutions Corporation [Japan]

Keywords: Array-parallel ADC, Back-illuminated global shutter, Region control, Region of interest, ROI

CONFERENCE PROCEEDINGS FREE ACCESS

Details

Abstract

A 4.1Mpix 280fps stacked CMOS image sensor with array-parallel ADC architecture is developed for region control applications. The combination of an active reset scheme and frame correlated double sampling (CDS) operation cancels Vth variation of pixel amplifier transistors and kTC noise. The sensor utilizes a floating diffusion (FD) based back-illuminated (BI) global shutter (GS) pixel with 2.4e-rms readout noise. An intelligent sensor system with face detection and high resolution region-of-interest (ROI) output is demonstrated with significantly low data bandwidth and low ADC power dissipation by utilizing a flexible area access function.

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