PROCEEDINGS OF THE ITE WINTER ANNUAL CONVENTION
Online ISSN : 2424-2306
Print ISSN : 1343-4357
ISSN-L : 1343-4357
2007
Session ID : 8-1
Conference information

Name : 2007 ITE Winter Annual Convention

Location : [in Japanese]

Date : December 18, 2007 - December 19, 2007

8-1 Reliability Test for Condenser Silicon Microphone
Yoshinori Iguchi, Masahide Goto, Kazuho Ono, Takehiro Sugimoto, Akio Ando, Futoshi Takeshi, Tooru Himori, Taiichirou Kurita, Toshifumi Tajima
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Abstract
We are studying a silicon microphone as a possible small high-performance microphone. We performed a reliability test on the microphone. The microphone was kept in an environment of 85℃ and 85% humidity. After 240 hours in this environment, no serious deterioration in frequency response or sensitivity was observed.
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© 2007 The Institute of Image Information and Television Engineers
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