PROCEEDINGS OF THE ITE WINTER ANNUAL CONVENTION
Online ISSN : 2424-2306
Print ISSN : 1343-4357
ISSN-L : 1343-4357
PROCEEDINGS OF THE 2015 ITE WINTER ANNUAL CONVENTION
Session ID : 12A-3
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Design and Evaluation of Lock-in Pixels using Backside-illumination type fully-depleted SOI Structure
*Ryo HASEGAWAKeita YASUTOMIHiroki KAMEHAMAYoon HungjuneSumeet ShresthaNobukazu Nobukazu TERANISHIKeichiro KAGAWAShoji KAWAHITO
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CONFERENCE PROCEEDINGS OPEN ACCESS

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Abstract
This paper suggests the lock-in pixel using the fully-depleted pixel of the backside-illumination type, which enable the high sensitive detection of near infrared light or X rays . We present simulation results for this structure and evaluation of the test chip.
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© 2015 The Institute of Image Information and Television Engineers
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