Host: 2017 ITE Winter Annual Convention
Name : 2017 ITE Winter Annual Convention
Date : December 12, 2017 - December 13, 2017
In marker-based deformation detection, taking account of only the detected marker limits the available positional information to only the marker, and causes excess or deficiency of the projected images. By using the information other than the marker, we find out adequate projection regions and generate correctly projected images.