Proceedings of Symposium on Ultrasonic Electronics
Online ISSN : 2433-1414
18
Session ID : PF1
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PF1 Some New Applications of Scanning Electron Acoustic Microscope to Materials Evaluation
Jiang FumingSeiji KojimaBingyang ZhangQingrui Yin
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CONFERENCE PROCEEDINGS FREE ACCESS

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© 1997 Institute for Ultrasonic Elecronics
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