P1-23 巨大熱電能を示すアモルファスSi-Ge-Au薄膜のPASによる熱処理による変化の評価(ポスターセッション1,ポスター発表)

岡本 庸一; 宮田 亜希子; 佐藤 義和; 滝口 裕章; 河原 敏男; 守本 純

doi:10.24492/iuse.23.0_53

Proceedings of Symposium on Ultrasonic Electronics

Online ISSN : 2433-1414

23

Session ID : P1-23

DOI https://doi.org/10.24492/iuse.23.0_53

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P1-23 The Measurement for Anneal Effect of Si-Ge-Au Amorphous Thin Film with Anomalously Large Thermoelectric Power by Using Photoacoustic Spectroscopy

Yoichi Okamoto, Akiko Miyata, Yoshikazu Sato, Hiroaki Takiguti, Toshio Kawahara, Jun Morimoto

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