Journal of Advanced Computational Intelligence and Intelligent Informatics
Online ISSN : 1883-8014
Print ISSN : 1343-0130
ISSN-L : 1883-8014
Regular Papers
Comparison of Knowledge Acquisition Methods for Dynamic Scheduling of Wafer Test Processes with Unpredictable Testing Errors
Tsubasa MatsuoMasahiro InuiguchiKenichiro Masunaga
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JOURNAL OPEN ACCESS

2015 Volume 19 Issue 1 Pages 58-66

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Abstract

The scheduling of semiconductor wafer testing processes may be seen as a resource constraint project scheduling problem (RCPSP), but it includes uncertainties caused by wafer error, human factors, etc. Because uncertainties are not simply quantitative, estimating the range of the parameters is not useful. Considering such uncertainties, finding a good situation-dependent dispatching rule is more suitable than solving an RCPSP under uncertainties. In this paper we apply machine learning approaches to acquiring situation-dependent dispatching rule. We compare obtained rules and examine their effectiveness and usefulness in problems with unpredictable wafer testing errors.

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