Journal of the Atomic Energy Society of Japan
Online ISSN : 2433-7285
Print ISSN : 1882-2606
Exposition
Soft errors in semiconductor devices due to environmental radiation
Simulation of soft errors due to environmental radiations
Shinichiro Abe
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Keywords: soft error, single event upset, Monte Carlo simulation, neutron, muon, PHITS, HyENEXSS
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2023 Volume 65 Issue 5 Pages 326-330

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[in Japanese]
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© 2023 Atomic Energy Society of Japan
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