Annealing evaluation of zircon using cathodoluminescence

Abstract

CL spectral analysis of annealed zircon samples up to 1200 degree C reveals that the band emission related to radiation-induced defect center in metamict state decreases in an increase of annealed temperature and disappeared above 700 degree C. The CL emission of intrinsic defect center in blue region gradually increases in heating due to a recovery of its crystal field. CL analysis can provide useful information on characteristic of the features of metamict zircon rather than other methods.