Study on crystal system of cordierite by Rietveld analysis and TEM

Abstract

Determination method of crystal system for cordierite has been studied. A precise X-ray diffraction experiment was performed and subsequently the Rietveld analysis was also performed. Precise structure coordinates was input into a TEM high resolution image simulation software. The arrangements of each atoms was drawn with high resolution silulated image and we compare  simulated image and actual image taken with TEM, and then a shape of the six-menbered ring composed both of Al and Si was been examined. The Al-Si ring shows a six-fold axis does not exist in cordierite structure in the present study.