Abstracts for Annual Meeting of Japan Association of Mineralogical Sciences
2016 Annual Meeting of Japan Association of Mineralogical Sciences
Session ID : R1-P01
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R1: Characterization and description of minerals
Mossbauer gamma-ray size focused using MCX measured by Si-PIN semi-conductor detector
*Keiji ShinodaYasuhiro Kobayashi
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Abstract

In the 2014 General Meeting of Mineralogical Society of Japan, we reported focus size of 14.4keV g-ray of Mössbauer microspectorometer using a multi-capillary X-ray lens (MCX) and proportional counter detector.  In that report, a proportional counter was used as γ-ray detector.  In this report, a Si-PIN semi-conductor, of which energy resolution is better than a proportional counter, is used to fix the spot size of focused g -ray by MCX. 

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© 2016 Japan Association of Mineralogical Sciences
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