Abstract
The Space Flyer Unit (SFU) was launched by the H-II rocket on March 18, 1995 and retrieved by the space shuttle on January 13, 1996 after six months space experiment. The compound semiconductor crystal growth experiments using the microgravity environments in space were executed and all experiments were completely carried out as planned and the experimental operation ended successfully. The evaluation of these specimens comfirmed that the space processed specimens are accompanied by various phenomena with respect to crystal growth mechanism, compositional homogeneity, uniformity of the layer thickness and reduction of crystal line defects, which are likely to have occurred in the presence of microgravity and convection-free conditions.
This paper presents summary of results of compound semiconductor crystal growth experiments in the SFU.