Record of Joint Conference of Electrical and Electronics Engineers in Kyushu
Record of 2004 Joint Conference of Electrical and Electronics Engineers in Kyushu
Session ID : 04-1P-04
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Host: Joint Conference of Electrical and Electronics Engineers in Kyushu

Evaluation of defects in crystalline Si nano clusters
*Masaharu Shiratani, Tomohide Kakeya, Kazunori Koga, yukio Watanabe
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© 2004 Committee of Joint Conference of Electrical and Electronics Engineers in Kyushu
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