Record of Joint Conference of Electrical and Electronics Engineers in Kyushu
Record of 2006 Joint Conference of Electrical and Electronics Engineers in Kyushu
Session ID : 02-1A-12
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Host: Joint Conference of Electrical and Electronics Engineers in Kyushu

A Study on LSI Tests Using Chaotic Sequences
Atsushi Izukura, Kunihiko Kudo, Akio Tsuneda, Takahiro Inoue
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© 2006 Committee of Joint Conference of Electrical and Electronics Engineers in Kyushu
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