Record of 2011 Joint Conference of Electrical and Electronics Engineers in Kyushu
Session ID : 05-1A-05
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Host: Joint Conference of Electrical and Electronics Engineers in Kyushu
High-speed Measuring Technique on Scanning Hall-probe Microscopy for Non-destructive Characterization of In-plane Distribution of Critical Current Density in Long-length REBCO Coated Conductor
Keitaro Okumura, Kohei Higashikawa, Kazutaka Imamura, Kei Shiohara, Yoshihiro Komaki, Masayoshi Inoue, Takanobu Kiss, Yasuhiro Iijima, Takashi Saito, Takato Machi
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