Record of Joint Conference of Electrical and Electronics Engineers in Kyushu
Record of 2024 Joint Conference of Electrical, Electronics and Information Engineers in Kyushu
Session ID : 06-2P-07
Conference information

Low-Frequency Characteristics of Traps in AlGaN/GaN HEMTs using Gate-Lag Measurements.
*[in Japanese][in Japanese][in Japanese][in Japanese][in Japanese][in Japanese]
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CONFERENCE PROCEEDINGS FREE ACCESS

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[in Japanese]
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© 2024 Committee of Joint Conference of Electrical, Electronics and Information Engineers in Kyushu
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