Journal of the Ceramic Society of Japan
Online ISSN : 1882-1022
Print ISSN : 0914-5400
ISSN-L : 0914-5400
Characterization
Analysis of Crystallographic Orientation on Textured Ca-doped (ZnO)mIn2O3 Ceramics by Electron Back Scattering Diffraction Pattern
Hisashi KAGAToshihiko TANIHiroaki KADOURAJuntaro SEKIRyoji ASAHI
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2006 Volume 114 Issue 1335 Pages 1022-1028

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Abstract

Crystallographic orientation and phase identification on textured Ca-doped (ZnO)mIn2O3 (m=3 and 4, denoted as ZmIO) ceramics were investigated for better understanding and further improvement of the high-efficiency n-type thermoelectric oxide materials. Textured ceramics were prepared by the reactive-templated grain growth (RTGG) method, in which plate-like reactive seeds were exploited. A combination of electron backscatter diffraction pattern (EBSP) and energy dispersive X-ray spectrometry (EDS) techniques was utilized for analyzing the textured specimen parallel and perpendicular to the original sheet plane in detail. We revealed that in the specimen plate-like grains were aligned parallel to the sheet plane with the thickness direction parallel to the c-axis of each grain. Parallel aligned trigonal Z3IO domains with a 60° misorientation angle were observed in a single grain. Coexisting trigonal Z3IO and hexagonal Z4IO phases were also observed in a single grain. These axis-sharing crystallites must be formed by the in situ topotactic conversion from a common hexagonal template crystal.

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© 2006 The Ceramic Society of Japan
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