1980 Volume 88 Issue 1018 Pages 316-321
X-ray diffraction intensity distribution obtained from anisotropic hexaferrite magnets with an uniaxial orientation was explained quantitatively by use of the “Texture pattern technique” developed by one of the authors. The degree of the orientation or the magnitude of the deviation from a random distribution is presented by two parameters, a Gaussian constant h and a randomness factor b. We could estimate more accurate degree of the orientation by this method than by the Lotgering's one because the diffraction peak overlapping in the case of the latter was not taken into account. Based on this method it was also concluded that the crystallite distribution even in so-called “isotropic” magnet was not completely random. A relationship between the degree of the orientation and Br/4πMs or (BH)max was linear.
