1992 Volume 100 Issue 1164 Pages 1085-1087
Strontium titanate (SrTiO3) films with a thickness in the range of 100-200nm were prepared by the sol-gel method using metal alkoxides as starting materials. The perovskite phase was observed by X-ray diffraction analysis of the films heat-treated over 600°C. The dielectric constant was 30-60, which is lower than that of SrTiO3 ceramics (250).