2001 Volume 109 Issue 1272 Pages 656-660
Diffraction-line broadening was observed in the X-ray diffraction (XRD) profiles for samples sintered in a relatively short period in the perovskite-type solid-solution systems, Ba(Zn1/3Ta2/3)1-xMxO3-δ(M=Y, In, Ga), and it decreased with prolonged sintering period. The line broadening was ascribed to a fluctuation of lattice spacing (Δd/d) that originated from structural imperfections due to ionic displacement, based on a β cosθ vs sinθ plot. Furthermore, as a characteristic tendency, when a larger dopant ion substituted for the (Zn1/3Ta2/3) site in the solid-solution systems, a larger initial value of Δd/d was observed which also decreased upon prolonged sintering. Electrical conductivity was strongly dependent upon Δd/d. The relationship between electrical conductivity and Δd/d was discussed from the viewpoint of disordering of the oxide ion.
