Journal of the Ceramic Society of Japan
Feature: Functions and Materials Design at Interfaces: Technical report
Angle resolved total reflection fluorescence XAFS and its application to Au clusters on TiO2(110) (1 × 1)
Wang-Jae CHUNKotaro MIYAZAKINaoki WATANABEYuichiro KOIKESatoru TAKAKUSAGIKeisuke FUJIKAWAMasaharu NOMURAKiyotaka ASAKURA
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Volume 119 (2011) Issue 1395 Pages 890-893

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Abstract

The bonding features and three dimensional structures of metal clusters on single crystal oxide surfaces can be determined by the polarization dependent total reflection fluorescence XAFS (PTRF-XAFS) method. K-edge XAFS has a cos2 θ polarization-dependence to give successfully three dimensional structure while L3 edge XAFS has a weaker polarization dependence though the L3 edge is suitable for Au and Pt samples. In order to overcome this issue, we have developed an angle-resolved total reflection fluorescence XAFS (ARTRF-XAFS) method to determine more precise three dimensional structures of Au clusters using the L3 edge by increase the number of data points. In this paper we described the methodologies of the ARTRF-XAFS and the results of Au clusters on the TiO2(110) surface.

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© 2011 The Ceramic Society of Japan
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