Abstract
The in-plane compressed (001)-epitaxial (Ba,Sr)TiO3 [BST] films with different Ba/Sr ratio were fabricated on (001)cSrRuO3/(001)SrTiO3 and (001)cSrRuO3/(001)(La,Sr)(Al,Ta)O3 by RF magnetron sputtering. Regardless of the Ba/Sr ratio, the in-plane compressive strain shifts the ferroelectric phase transition to higher temperatures; however, the magnitude of its impact varies by the Ba/Sr ratio. With increasing the Ba/Sr ratio, the sensitivity to the strain becomes larger, which can be associated with the compositional dependence of Curie–Weiss constant, electrostrictive constant and elastic constant of BST.