Abstract
Fluorine-doped tin oxide (SnOx:Fy) anti-reflection films coated on the surface of silicon spheres were investigated to clarify the effects of heat treatment on the microstructure and optical properties of the SnOx:Fy films. The lattice constants, crystallite size, and bandgap of the SnOx:Fy films depended on both heat treatment temperature and time. Fluorescence spectra of the SnOx:Fy films showed a broad luminescence peak associated with point defects in the films. These results were attributed to the dependence of the O and F contents in the SnOx:Fy crystals on heat treatment conditions.