Journal of the Ceramic Society of Japan
Online ISSN : 1348-6535
Print ISSN : 1882-0743
ISSN-L : 1348-6535
Feature: Cutting edge research on electroceramics 2016: Full papers
An optical method for evaluating the degradation mechanism of a developing RuO2 thick film resistor element for power modules
Yoshinobu NAKAMURAYuki KITANAKAMasaru MIYAYAMATakeshi ITOKoichi URANOKiyoshi TANAKATomohiko NAKAJIMATetsuo TSUCHIYA
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2017 Volume 125 Issue 6 Pages 476-481

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Abstract

We devised a simple and noninvasive method for evaluating the spacial distribution of local electron densities of a thick-film RuO2-based chip resistor using UV–VIS-IR reflectance microscopy. After a long-term durability test for 874 h under an elevated temperature of 623 K, RuO2 resistors were thermally damaged, and their resistance became more than 10% higher. We identified the thermally damaged region by this new method and found that the thermal degradation is mainly due to an increase in the resistance between the Ag electrode and the RuO2 resistor film.

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© 2017 The Ceramic Society of Japan
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