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Dielectric breakdown behavior of oxynitride glass
Yuki Nakashima, Hirokazu Katsui, Kiyoshi Hirao, You Zhou, Tatsuki Ohji, Norimitsu Murayama, Manabu Fukushima
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Keywords:
Dielectric breakdown strength,
oxynitride glass,
silicon nitride,
McKewon electrode,
thickness
Article ID: 25022
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