Direct Structure Determination of Thinfilm Interface by X-ray CTR Scattering

Abstract

We report our recent approach to the direct structure analysis of X-ray crystal truncation rod scattering data for thinfilm interface structures. Our approach is a combination use of a holographic method and the iterative phase-retrieval methods, which are respectively used for the direct construction of the initial structure model and the final refinement of the model. Results of the direct structure analysis for a Bi thinfilm and Bi/Bi₂Te₃ topological insulator thinfilm are presented. The holographic method successfully imaged out interfacial wetting layers for both the systems. Structural parameters were derived quantitatively by using the phaseretrieval methods, which are relevant to understanding electronic properties and film growth mechanisms at the interfaces.