Nihon Kessho Gakkaishi
Online ISSN : 1884-5576
Print ISSN : 0369-4585
ISSN-L : 0369-4585
Review Articles
Synchrotron X-ray Powder Diffraction Studies of Accurate Structure-Factors Measurement and Ab Initio Structure Determination
Eiji NISHIBORI
Author information
JOURNAL FREE ACCESS

2018 Volume 60 Issue 2-3 Pages 88-95

Details
Abstract

Our synchrotron radiation(SR)X-ray powder diffraction studies of accurate structure factors measurement and ab-initio structure determination during past couple of decades have been described with some details. These studies were carried out using SR powder profiles measured at SPring-8. This paper organized as follows:First the performance and an advantage of powder diffraction profile measured at SPring-8. Second, accurate structure factors measurement using SPring-8 together with recent topics. Third, we introduced the strong point of SPring-8 data for structure determination from powder diffraction with some examples. Finally, I will describe summary of this paper.

Content from these authors
© 2018 The Crystallographic Society of Japan
Previous article Next article
feedback
Top