Special Issue Recent Development of Electron Beam Analyses
Crystal Structure Analysis Using Scanning Transmission Electron Microscopy
2019 Volume 61 Issue 1 Pages 15-22
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2019 Volume 61 Issue 1 Pages 15-22
Crystal structure analysis using scanning transmission electron microscopy（STEM）is briefly reviewed. The various imaging techniques, such as bright field（BF）, annular BF（ABF）and annular dark-field（ADF）are presented. Recent progress in STEM imaging is also described.
