Analysis of Extended X-ray Absorption Fine Structure by Sparse Modeling

Abstract

We propose a new method to extract the informations of microscopic structure from the extended X-ray absorption fine structure by the application of sparse modeling based on a simplified single-scattering approximation of photo-electron waves. This method can extract the sparse radial distribution function of the atoms located nearby the target atom and can estimate the Debye-Waller factor without any assumption of the micro-structures. Therefore, this method is expected to exhibit considerable ability in the crystallographic researches on new materials and such cooperative researches of data-driven science and crystallographic measurements are strongly expected to extend the frontiers in various research fields.