Nihon Kessho Gakkaishi
Online ISSN : 1884-5576
Print ISSN : 0369-4585
ISSN-L : 0369-4585
The 70th Anniversary of the Crystallographic Society of Japan (2) Future Perspective
The Future of Crystallography Led by Electron Beams
Eiji ABE
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2020 Volume 62 Issue 4 Pages 248-252

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Abstract

I will describe the future direction of electron crystallography, by focusing on how electron beams contribute uniquely for atomic structure determinations. Both for electron diffraction and microscopy, the key lies on how we make the best use of dynamical scattering effects, which are significant for electrons compared with other probes including X-ray.

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© 2020 The Crystallographic Society of Japan
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