TEION KOGAKU (Journal of Cryogenics and Superconductivity Society of Japan)
Online ISSN : 1880-0408
Print ISSN : 0389-2441
ISSN-L : 0389-2441
Originals
Effects of Water Vapor Partial Pressure on Microstructure Evolution in YBa2Cu3O7-y Films Deposited by Advanced TFA-MOD Method
Junko S. MATSUDA, Yoshitaka TOKUNAGA, Ryo TERANISHI, Koichi NAKAOKA, Hiroshi FUJI, Yuji AOKI, Yutaka YAMADA, Teruo IZUMI, Yuh SHIOHARA
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2004 Volume 39 Issue 11 Pages 578-584

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Abstract
YBa2Cu3O7-δ (Y123) films were deposited under various water vapor partial pressures (P(H2O)) in the crystallization process by an advanced metalorganic deposition (MOD) method using trifluoroacetates. Microstructures of the films were evaluated by means of transmission electron microscopy. As a result, in the Y123 film crystallized under lower P(H2O) such as 2.1%, large pores were remarkably observed. Furthermore, there were many amorphous layers of non-superconducting phases in the film. In contrast, small pores were distributed in the films deposited under higher P(H2O) of 4.2, 6.3 and 13.5%. Considering that the critical current (Ic) values become higher as P(H2O) increases, the existence of large pores and non-superconducting phase compounds causes a reduction in Ic. By investigating the microstructures of the films quenched during the crystallization process, it was found that the pores in the films are generated by the reaction of the non-superconducting phases trapped in the growing Y123 film, which then transform to Y123 afterwards accompanied by volume reduction of about 30%. The sizes of the entrapped phase crystals in the Y123 film depend on the P(H2O), and this may determine the pore sizes in the final film.
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© 2004 by Cryogenics and Superconductivity Society of Japan (Cryogenic Association of Japan)
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