Abstracts of Meeting of the CSSJ
The 222nd Meeting of the Crop Science Society of Japan
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Host: Crop Science Society of Japan

Form/Growth adjustment/Gene
Scanning Electron Microscopy of the Reserves Accumulation in Graded Wheat Grains
*Ichie KODA, Toshiaki MATSUDA, Yoshitsugu TAKAHASHI, Youji NITTA
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Keywords: Wheat, Scanning Electron Microscopy
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Pages 222

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© 2006 The Crop Science Society of Japan
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