Measurement of Oolitics Content by Correction X-ray Diffraction Silica Program with Norm Method

Abstract

  The silica program (SP) requiring basic sand correction was developed in 1975 to measure oolitics. At that time, silica sand was used as the basic sand. Currently, various types of sands (e. g. silica sand, slug sand, ceramic sand and etc.) are being used and mixed in foundry factories. However, the sand mixing process makes it difficult to correct the basic sand during measurement. The authors thus developed several new programs. The first was the X-ray diffraction correction silica program (XSP) developed in 1999, and the second was the improved X-ray diffraction correction silica program (XSPI) developed in 2011. The current version is the Norm method and X-ray diffraction correction silica program (NXSP) developed in 2012.

  In this study, the authors investigated the trend of green sand characteristics between 1985 and 2010, and found that the oolitics content increases without basic sand correction. We also outlined the measurement principle of the new silica programs methods developed. The green sand of 25 molding lines was measured using each silica program. The average oolitics amount was 22.7mass% with SP, 13.0mass% with XSP, 10.9mass% with XSPI, and 8.5mass% with NXSP, confirming that it is possible to determine the exact oolitics amount using the NXSP method.