JOURNAL OF THE ILLUMINATING ENGINEERING INSTITUTE OF JAPAN
Online ISSN : 1349-838X
Print ISSN : 0019-2341
ISSN-L : 0019-2341
Original Papers
Impurity Doping and Its Effect on the Carrier Injection Efficiency of a Nanocrystalline Silicon Electroluminescent Device
Keisuke SatoKazuki NiinoNaoki FukataKenji Hirakuri
Author information
JOURNAL FREE ACCESS

2009 Volume 93 Issue 5 Pages 307-311

Details
Abstract
We developed an electroluminescent (EL) device using boron-doped nanocrystalline silicon (nc-Si) particles that effectively inject a carrier into a luminous layer at a low direct current (DC) voltage of 2.0 V. The injection efficiency of the carrier strongly depends on the boron concentration. The injection quantity of a carrier in an EL device with a high boron concentration of 2.3 at.% was made almost double that of an EL device without boron doping. This was due to both the lowering of the series resistance of the EL device using the doping of boron into nc-Si particles and the coagulation of nc-Si particles using a hydrofluoric acid (HF) treatment. The injection quantity of the carrier can be considerably improved using boron doping into the nc-Si particles and the HF treatment.
Content from these authors
© 2009 The Illuminating Engineering Institute of Japan
Previous article
feedback
Top