JOURNAL OF THE ILLUMINATING ENGINEERING INSTITUTE OF JAPAN
Online ISSN : 1349-838X
Print ISSN : 0019-2341
ISSN-L : 0019-2341
Analysis of oxide bias measurement in the silicon photodiode self-calibration technique
Yoshihiro Ohno, Hideo Nishiyama
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1987 Volume 71 Issue Appendix Pages 45-46

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