[journal title in Japanese]
Online ISSN : 1884-3247
Print ISSN : 0916-7269
A feature of Silicon Carbide Semicondactor and its Application
Toshitake NakataTomoaki YonedaMasanori WatanabeTomio OyamaMorio Inoue
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JOURNAL FREE ACCESS

1995 Volume 21 Issue 2 Pages 98-105

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Abstract
Recently, silicon carbide (SiC) single crystal in the diameter of 3 inches have been developed and micropipes have been reduced to 3/cm2 using the vaccum sublimation method. SiC JFET, MESFET and other devices operable at higher temperatures and higher power more than silicon devices have been realized in the research stage.
We report a feature of silicon cabide, the present state of device fabrication techniques and silicon carbide devices.
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© The Japan Institute of Power Electronics
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