Journal of the Japanese Association for Crystal Growth
Online ISSN : 2187-8366
Print ISSN : 0385-6275
ISSN-L : 0385-6275
Microfacets in GaSb Czochralski-Grown Crystals
Masashi KumagawaYasuhiro Hayakawa
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1986 Volume 13 Issue 2-3 Pages 131-135

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Abstract
GaSb single crystals containing Te as an impurity were pulled from the melt by the Czochralski method. Microfacets concerning with local segregation phenomena were investigated in these crystals. They appeared when deep holes on irregular crystal surfaces caused by remelting were filled in with bulk material during regrowth. Furthermore, line patterns showing a sawtoothed shape were observed in the transition region between peripheral facet and off-facet regions. They were formed with {111} facet planes. A macrofacet region developed from a microfacet was also found in pulled crystals.
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© 1986 The Japanese Association for Crystal Growth
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