Journal of the Japanese Association for Crystal Growth
Online ISSN : 2187-8366
Print ISSN : 0385-6275
ISSN-L : 0385-6275
22aB4 In situ monitoring of cubic-GaN atomic layer epitaxy
M MayumiY NishimoriA KoukituH Seki
Author information
JOURNAL FREE ACCESS

1999 Volume 26 Issue 2 Pages 22-

Details
Abstract
In situ gravimetric monitoring of atomic layer epitaxy (ALE) of a cubic-GaN on GaAs (001) is investigated by a halogen transport system using GaCl and NH3 sources. The cubic-GaN growth of one monolayer / cycle is obtained at the temperature range from 350 to 400℃. The growth rate decreases with increasing temperature, and then the growth rate in one ALE cycle keeps a constant at about 0.45 from 410 to 450℃. Also, it is shown that a pure cubic-GaN can be grown by a halogen transport ALE.
Content from these authors
© 1999 The Japanese Association for Crystal Growth
Previous article Next article
feedback
Top