Characterization of Polycrystalline Si by Photographic Surveying Using Electroluminescence(<Special Issue>Crystals Science and Technology of Solar Cells Materials -Concentrated on Crystal Growth-)

Abstract

Crystalline Si solar cells emit infrared light under the forward bias as so called "Electroluminescence". Photographic diagnosis technique has been developed to analyze not only the intrinsic defects (crystallographic defects, grain boundaries, etc.) but also the extrinsic deficiencies (substrate breakage and electrode snapping).