Journal of the Japanese Association for Crystal Growth
Online ISSN : 2187-8366
Print ISSN : 0385-6275
ISSN-L : 0385-6275
Investigation of Reactions at High Pressures and Temperatures by in situ Synchrotron Radiation X-ray Diffraction Measurement-In situ X-ray Diffraction Measurements of Hydrogenation Reactions of Aluminum(<Special Topic>Crystal Growth under High Pressure)
Hiroyuki SaitohAkihiko MachidaYoshinori KatayamaKatsutoshi Aoki
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2011 Volume 38 Issue 1 Pages 55-61

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Abstract
Structural information of specimens can be obtained in situ at high pressures and temperatures using a cubic-type multi-anvil press and synchrotron radiation x-ray diffraction measurements. This system enables us to clarify reaction mechanism at high pressures. In the present paper, energy dispersive and angle dispersive in situ x-ray diffraction measurement systems are explained. Hydrogenation reaction of aluminum has been investigated via these methods, and the results are described. These methods are expected to be useful for crystal growth studies at high pressures and temperatures.
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© 2011 The Japanese Association for Crystal Growth
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