Development of combinatorial defect analysis with an intense positron microprobe

Nagayasu Oshima; Yasuhiro Kamada; Hideo Watanabe; Atsushi Kinomura; Ryoichi Suzuki

doi:10.56646/jjapcp.2.0_011306

2nd Japan-China Joint Workshop on Positron Science (JWPS2013)

Session ID : 011306

DOI https://doi.org/10.56646/jjapcp.2.0_011306

Conference information

Host: The organizing committee of JWPS2013

Name : 2nd Japan-China Joint Workshop on Positron Science (JWPS2013)

Location : Tsukuba, Japan

Date : December 20, 2013 - December 23, 2013

Advances in analytical techniques and instrumentation

Development of combinatorial defect analysis with an intense positron microprobe

Nagayasu Oshima, Yasuhiro Kamada, Hideo Watanabe, Atsushi Kinomura, Ryoichi Suzuki

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CONFERENCE PROCEEDINGS OPEN ACCESS

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Abstract

The concept of combinatorial defect/pore analysis using an intense positron microprobe is proposed. This combinatorial method is suitable to analyze defects/pores for a large number of samples systematically. A test of this method was performed by applying it to the analysis of ion beam irradiated Fe film samples.

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