Japanese Journal of Radiation Safety Management
Online ISSN : 1884-9512
Print ISSN : 1347-1503
ISSN-L : 1347-1503
Original paper
Fundamental Characteristics of a Semiconductor Survey Meter
Hiroki ISHIIKo SATSURAINaoto UESUGIMakiko KATOMarina SANNOHEKohei MIYATAYohei INABAKoichi CHIDA
Author information
JOURNAL FREE ACCESS

2018 Volume 17 Issue 1 Pages 2-8

Details
Abstract

 It is important to measure scattered radiation in diagnostic radiology in terms of evaluation of occupational exposure and leakage radiation dose. Recently, Unfors RaySafe (Sweden) released a solid-state survey sensor aimed at expanding RaySafe X2 system. However, there are no detailed reports regarding the performance, which includes energy dependence and angular dependence, of X2 survey meter. The purpose of this study was to evaluate the performance of X2 survey meter. Experiments were conducted to compare the performance of X2 survey meter with that of an ionization chamber survey meter. The results showed that the fundamental performance of X2 survey meter were equal to or superior to that of an ionization chamber survey meter. In addition, X2 survey meter is easy to handle. The study concludes that X2 survey meter has adequate performance for measurement of scattered radiation in diagnostic radiology.

Content from these authors
© 2018 Japanese Society of Radiation Safety Managenent
Previous article Next article
feedback
Top