Relationship between Incident Dose on the Imaging Plate and S Value Associated with Computed Radiography(CR)Systems : Quantitative Evaluation Using Uniform Exposure

Abstract

Practical experiments were done to quantify basic properties of the imaging plate(IP). The relation was investigated between incident dose on the IP and the S value associated with computed radiography. An acrylic phantom and uniform exposure were used for this study. The effects of the properties of incident dose(tube voltage, exposed dose, and grid application) and IP(fading time and period of use) on the S value were measured. Results indicated that determination of the S value depended on tube voltage and fading of the IP, but not on exposure dose or period of IP usage. The effects of grid use could be estimated with the grid's bucky factor and scattering factors. We concluded that these results were useful for research using the IP as an x-ray detector and for estimating incident dose by using the S value.