Abstract
Tensile strain testing was conducted on standard thin films: Tris(8-hydroxyquinolinato)aluminum (Alq3), Bis [N-(1-naphthyl)-N-pheny] benzidine) (α-NPD), and mixed layers of 1/1 Alq3/α-NPD. Alq3 films were found to possess the highest ductility and the ductility of α-NPD thin films was found to improve by mixing with Alq3. In order to improve the ductility of the OLED with a conventional structure of glass/indium-zinc-oxide (IZO)/molybdenum oxide (MoO)/α-NPD/ Alq3/MgAg, the α-NPD layer was replaced by a mixed layer of Alq3 and α-NPD.