Abstract
In the x-ray stress measurement, diffraction lines have to be corrected for the LPA (Lorentz-polarization and absorption) factor to accurately determine the stress. The absorption factors for the fixed-ψ and ψ0 methods using the iso-inclination method, and the fixed-η and η0 methods using the side-inclination method were given. In the usual x-ray stress measurement, an area of x-ray irradiation on the surface of a specimen increases with increasing yr angle, The absorption factors for the measurement with restricted irradiation area at all ψ angles are also given. Using quenched and tempered steel specimens having various diffraction line widths, the effect of the LPA factor on the stress value was investigated. The LPA factor has stronger influence on the stress value as the line width increases. In the side-inclination method, the correction for the LPA factor has little influence on the stress and it can be omitted. The correction for the LPA factor has no influence on the diffraction line width. The equation for calculating the standard deviation of the difference between stresses with and without correction for LPA factor was derived.
