Journal of the Japan Society for Precision Engineering
Online ISSN : 1882-675X
Print ISSN : 0912-0289
ISSN-L : 0912-0289
Field Ion Microscopy
Kazuhiro HONO, Toshio SAKURAI
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Keywords: field ion microscopy (FIM), atom probe (AP), scanning tunneling microscope (STM)
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1991 Volume 57 Issue 7 Pages 1145-1149

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