Abstract
We examined compatibility of sputtered tungsten (W) films with lithium oxide (Li2O, tritium breeding materials) single crystals, the surface of which were passivated by aluminum (Al), silicon (Si) or titanium (Ti) by Rutherford backscattering spectroscopy (RBS). Initial small chemical reactions were observed after heating at 573 K for 1 min in vacuum of 10-6 Pa for each sample. After further heat treatments from 573 K to 723 K there was no additional drastic diffusion.