Abstract
The lattice constant of the NiZnCu ferrite was evaluated by X-ray diffraction using the synchrotron radiation source. In the experiment of the powder X-ray diffraction under pressure, the lattice constant shows the different values between the increment process and the decrement process. The behavior is similar to the change of the inductance under pressure. On the other hand, in the experiment of the mapping on the simplified multilayer chip inductor, the lattice constant depends on the sintering temperature and the location in the device. Moreover, Ag particles diffused from the Ag-conductor are found on the sample sintered at 920°C by Electron Probe Micro-Analysis. These results suggest that the lattice distortion of the NiZnCu ferrite caused by the stress from Ag-conductor and Ag-diffusion affects the magnetic permeability.
