Journal of the Japan Society of Powder and Powder Metallurgy
Online ISSN : 1880-9014
Print ISSN : 0532-8799
ISSN-L : 0532-8799
Thick Film With Low Resistivity Formed by Ultrafine Particles of Ag and Pd Single Crystals
Susumu Kasukabe
Author information
JOURNAL OPEN ACCESS

1992 Volume 39 Issue 3 Pages 231-234

Details
Abstract
Ultrafine particles less than lum in diameter show a characteristic property originating from the size effect. For their effective industrial applications, ultrafine particles of a single crystal. having active crystallographic planes were produced by gas-evaporation technique.
Ultrafine particles of Ag and Pd were formed by controlling their particle size and crystal habit. The experiments of the sintering of these Ag particles showed a drastic lowering of a melting point: the sintering temperature of Ag of 30-150nm was 150-210°C. The smaller the particle size became, the lower the sintering temperature was obtained. When these ultrafine particles were applied for the conventional process of Ag and/or Ag-Pd thick film, the low resistivity of the film were obtained by forming a dense film. These experimental results are due to the effect of the surface activity of a ultrafine particle.
Content from these authors
© Japan Society of Powder and Powder Metallurgy

本論文はCC BY-NC-NDライセンスによって許諾されています.ライセンスの内容を知りたい方は,https://creativecommons.org/licenses/by-nc-nd/4.0/deed.jaでご確認ください.
https://creativecommons.org/licenses/by-nc-nd/4.0/deed.ja
Previous article Next article
feedback
Top