Abstract
Degradation behavior of insulation resistance(IR) of BaTiO3-based Ni-electrode multilayer ceramic capacitors (MLCC) has been studied with special reference to the material parameters. The degradation behavior shows clear dependence on the ambient atmosphere during firing, the doping, and the grain boundary chemistry. The degradation of IR is thought to be caused by the electrolytic migration of oxygen vacancies. A/B of grain boundary should be higher than the unity, in order to achieve long life. Consequently, we have developed high capacitance MLCCs as 10.5μF in 3216 type with superior reliability.